Quality and Reliability Engineering
Document # Document Name Publication Date
10065105B-ENG 450 mm Demonstration Test Method (DTM) 01/18/2012
10065100A-ENG 450 mm Factory Integration Maturity Assessment (FIMA) 06/17/2010
04054532A-TR Assembly Analytical Forum Analytical Tool Roadmap White Paper 06/25/2004
04034510A-TR Comparing the Effectiveness of Stress-based Reliability Qualification Stress Conditions 04/12/2004
04024492A-TR Understanding and Developing Knowledge-based Qualifications of Silicon Devices 03/30/2004
03024377A-TR Critical Reliability Challenges for The International Technology Roadmap for Semiconductors (ITRS) 03/31/2003
01084148A-XFR Call for Improved Electromigration Simulation Tool 08/09/2001
01054118A-XFR Call for Improved Ultra-Low Background Alpha-Particle Emission Metrology for the Semiconductor Industry 05/14/2001
00124038A-XFR Signature Failure Analysis-Based Methodology for Customer Failure Analysis 12/08/2000
00053955A-XFR Semiconductor Device Reliability Failure Models 05/31/2000
00053958A-XFR Knowledge-Based Reliability Qualification Testing of Silicon Devices 05/31/2000
99083810A-XFR Use Condition Based Reliability Evaluation of New Semiconductor Technologies 08/20/1999
99083813A-XFR Use Condition Based Reliability Evaluation: An Example Applied to Ball Grid Array (BGA) Packages 08/20/1999
97123436B-XFR Administrative Quality Best Practices 07/27/1998
98043497A-XFR Optimization of Moisture and Thermal Mechanical End of Line Monitors (EOLMs) 04/30/1998
98013452A-TR Test Structures for Benchmarking the Electrostatic Discharge (ESD) Robustness of CMOS Technologies 02/25/1998
98013448A-TR Overview of Quality and Reliability Issues in the National Technology Roadmap for Semiconductors 01/20/1998